Estimate on the uncertainty of predicting radiated emission from near-field scan caused by insufficient or inaccurate near-field data

摘要

Near-field scan on a Huygens’ box can be used in order to predict the maximal radiated emission from a Printed Circuit Board. The significance of step size and phase accuracy, and the importance of a full Huygens’ box are investigated by simulation of two different models with two different numerical methods. The prediction of maximal radiated emission is quite robust but the results also show that a full scan on all six surfaces is probably needed.